Topics of Interest


Papers in the following areas are requested.

Specific Focused Call for Papers documents now available!


ADVANCED LOGIC TECHNOLOGY (ALT)

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Papers are solicited in the areas of CMOS platform technologies and applications (e.g., HPC, LOP, mobile, automotive, low-temperature CMOS, etc.), logic devices and circuits, process integration schemes for advanced nodes, innovations in material, process and metrology techniques, and design technology co-optimization (DTCO) and system technology co-optimization (STCO). Platform technologies include state-of-the-art Si and beyond-Si channel devices, gate-all-around devices, stacked devices with different polarity transistors, advanced interconnect, novel power distribution integration schemes, heterogenous 2.5D/3D integration schemes, and BEOL compatible transistors. Device architecture, device design and analysis, process integration, module advancements in process and patterning, metrology, physical layout effects, techniques for reduced variability, yield, thermal management, methodologies and solutions for DTCO/STCO in the solicited areas are of high interest.

EMERGING DEVICE and COMPUTE TECHNOLOGY (EDT)

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Papers are solicited on emerging nano-electronic devices and physics. This includes devices based on novel transport and control mechanisms such as tunnel FET, negative capacitance FET, cold-source FET, topological materials and devices, phase transitions, ferroelectrics and quantum effects. Devices based on low‐dimensional systems including 2D materials, CNTs, nanowires, single electron transistors and quantum dots are welcomed. Exploratory devices with novel device functions and/or novel materials for neuromorphic compute, approximate and analog compute, and non-charge-based compute such as spintronics are key topics. Furthermore, emerging state machines and time dynamical compute systems are also of interest. Qubit devices as well as devices and systems designed to enable quantum computing, quantum simulation and quantum annealing are of high interest. Papers in EDT focus primarily on device physics and novel elaboration concepts.

MEMORY TECHNOLOGY (MT)

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Papers are solicited in the areas related to embedded and standalone memory technology. This includes advances in both conventional memories including SRAM, DRAM and Flash, and emerging memories including ReRAM, MRAM, PCRAM, ferroelectric memory, crosspoint memory and selectors, organic memory and NEMS‐based memory, as well as their applications in the areas of AI and near-Memory compute. Topics span from demonstration of novel device concepts to fully integrated memory arrays, and from product prototyping to manufacturing related challenges and solutions. Demonstrations of manufacturing maturity of emerging memories and future scaling of conventional memories to solve the memory wall issues are of high interest. Submission of papers on novel device concepts and demonstrations, novel integration schemes, novel circuit design schemes, and novel memory architectures that enhance memory performance, scaling, 3D stacking, capacity/bandwidth increasing, and power/energy reduction are strongly encouraged. Papers based on novel device physics and in-memory computing may be transferred to EDT or NC at the discretion of the committee.

MODELING and SIMULATION (MS)

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Papers are solicited on theoretical approaches to electronic devices, including logic devices, memory devices, optical devices, interconnects and (bio)sensors. Theoretical approaches include analytical, numerical, statistical, and machine-learning/AI-based approaches applied to structures with dimensions ranging from atomistic over device dimensions to full-chip dimensions, including physics-based compact modeling. Key to submissions is, that the device innovation is central, either through predictive insight in the potential of novel device concepts, predictive analysis revealing significant improvement to devices, breakthroughs in the theoretical understanding of the device operation, breakthroughs in the understanding of device processing enabling improved device performance, novel insights in variability, reliability and yield issues, breakthrough in device optimization based on DTCO. Topics also include ab-initio/atomistic materials modeling, modeling of neuromorphic computing, quantum computing, spintronics, low-dimensional devices, ferroelectrics, thermal modeling, 3D/heterogeneous integration, electro-chemical/mechanical devices. Comparison with experimental data, model calibration and multi-scale simulation chains are highly encouraged.

NEUROMORPHIC COMPUTING (NC):

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Papers are solicited in the areas related to devices, circuits, and algorithms for neuromorphic computing and AI. We welcome submissions covering a wide range of areas in neuromorphic computing including but not limited to: analog in-memory deep learning, compute-in-memory, probabilistic/approximate/analog computing, combinatorial optimization, machine learning, and AI applications, edge computing, unclonable functions, reservoir computing, spiking neural network, artificial intelligence, in-sensor computing, and bio-inspired computing based on memory/logic/sensor/nanoelectronic/MEMS devices and their novel architecture and physics. Demonstration of real-world applications, full hardware integration, device-algorithm co-optimization, novel device concepts improving computational efficiency, and new algorithms mitigating non-ideal properties of devices and materials are of high interest.

OPTOELECTRONICS, DISPLAYS, and IMAGING SYSTEMS (ODI)

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Papers are solicited on optoelectronics, displays, and imaging systems. This includes novel devices, structures, and integration for image sensors, displays, light sources, photonic devices, and high-speed photodetectors and modulators. New technologies on heterogeneous integration of optoelectronics as well as on photonic-electronic integration for optical interconnects, on-chip networks and sensing are welcomed. Papers on quantum photonics, neuromorphic photonics, and plasmonics for quantum computation, sensing and encryption are also of interest. Furthermore, ODI includes CMOS imagers, high-speed and high-time resolution imagers, CCDs, stacked, single-photon and non-visible image sensors. In addition, papers on displays for augmented or virtual reality, holography, TFTs for photonics applications, flexible, stretchable, and/or printed electronics, in-display sensors are encouraged. Papers on displays or light emitting devices with novel materials such as perovskites or quantum dots are also of interest. We particularly welcome submissions concerning optoelectronic or photonic devices or systems based on topological concepts.

POWER, MICROWAVE/MM-WAVE and ANALOG DEVICES/SYSTEMS(PMA)

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Contributions are sought on novel circuit topologies, manufacturing processes, supporting modeling (TCAD and compact models), device physics, reliability, and materials (SiC, (Al)GaN, diamond, Ga2O3, Si, III-Vs, etc.) along with fundamental studies on doping, deep-level traps, interface state densities, and device reliability for power and/or high frequency devices. Papers are solicited on discrete and integrated power and/or high frequency (micro, mm-wave and THz) devices and physics, modules and systems. Topics of interest include devices (diodes, BJTs, FETs, super-junction devices, heterostructures, IGBTs, HEMTs, HBTs, light-triggered structures for galvanic isolation and faster switching, bi-directional switches, vertical geometry devices, etc.) and device/package/circuit interactions, including thermal management. Wide variety of applications are also of interest (power conversion, supply, regulation and conditioning for computers and data centers, motor drives, transportation, solar, wind, smart grid applications, wireless power harvesting/transfer, filters, beam formers, power amplifiers, tunable passives, antenna arrays, SAW/BAW).  

RELIABILITY OF SYSTEMS and DEVICES (RSD)

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Papers are solicited in reliability evaluation (experimental and modeling) of logic and memory devices, interconnects, and circuits and systems, mainly (but not limited) to employing Si-based technologies. Specific reliability topics include, for FEOL: transistor degradation due to hot carriers, bias temperature instabilities, random telegraph noise, and aging model; dielectric SILC and wear‐out. For MEOL/BEOL, topics include breakdown of MEOL spacers and BEOL dielectrics; electromigration, stress migration failures of contacts and interconnects. For product, system, and circuit reliability, topics include latch‐up, ESD, soft error mechanisms, variability-aware design, and design for reliability, robustness, and security of electronic circuits and systems. Of particular interest are investigations of degradation mechanisms for devices, circuits, and systems in the following areas: conventional and emerging memories; beyond CMOS devices; 3D IC package reliability, more-than-Moore applications; biomedical devices and systems; automotive and aerospace.

SENSORS, MEMS, and BIOELECTRONICS (SMB)

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Papers are solicited in the areas of sensors, micro/nano electromechanical systems (MEMS and NEMS), microfluidics/lab-on-chip, and BioMEMS, with particular emphasis on new device concepts, integrated and highly parallel CMOS implementations, CMOS-on-MEMS, embedded machine learning, organic-inorganic hybrid microfabrication, flexible devices, and multimodal sensors on a chip for applications in health, medicine, communication, mobility, and energy. Sensors include chemical, molecular and biological detection based on acoustic, electrical, electrochemical, magnetic, mechanical and optical principles. Topics of interest in the MEMS area include actuators, physical and biochemical sensors (BioMEMS), resonators, integrated inertial measurement units, RF MEMS, optomechanical devices, micro-power generators, and devices for energy harvesting as well as on-chip energy storage. Bioelectronics covers organic‐inorganic hybrid devices, point-of-care biomedical devices, bio‐electronic interfaces, integrated biomedical sensing, and implantable sensors and neural interfaces.