IEDM

IEDM Characterization, Reliability and Yield Committee

Anthony S. Oates, Chair
TSMC

Paul Hurley
Tyndall University

Tanya Nigam
Globalfoundries Malta

Miaomiao Wang
IBM

Hideki Aono
Renesas Electronics

MoonYoung Jeong
Samsung Electronics

Dimitri Linten
IMEC

Charles Cheung
NIST

Gilles Reimbold
CEA/Leti

Dhanoop Varghesse
Texas Instruments

Hokyung Park
SK Hynix

Weir Bonnie
Broadcom

Kenji Okada
TowerJazz Panasonic Semiconductor