IEDM

IEDM Characterization, Reliability and Yield Committee

Gianluca Boselli, Chair
Texas Instruments
Dallas, TX

Su Jin Ahn
Samsung Electronics
Gyeonggi-do, Korea

Alain Bravaix
ISEN Toulon
Toulon, France

Mikael Casse
CEA-Leti
Grenoble, France

Francesco Driussi
University of Udine
Udine, Italy

Ahmad Ehteshamul Islam
Airforce Research Laboratory
Beavercreek, OH

Ben Kaczer
IMEC
Leuven, Belgium

Ziyuan Liu
Renesas
Isogo-ku, Japan

Souvik Mahapatra
IIT Bombay
Mombai, India

Yuichiro Mitani
Toshiba
Kanagawa, Japan

Rosana Rodriguez
University Autonoma Barcelona
Bellaterra, Spain

Wen-Jer Tsai
Macronix
Hsinchu, Taiwan

Ernest Wu
IBM
Essex Junction, VT

Jian Zhang
Liverpool John Moores University
Liverpool, UK