IEDM

IEDM Characterization, Reliability and Yield Committee

Jungwoo Joh, Chair
Texas Instruments

Hideki Aono
Renesas

Jiezhi Chen
Shandong University

Paul Hurley
Tyndall

MoonYoung Jeong
Samsung

Chris Kim
University of Minnesota

Seokkiu Lee
SK Hynix

Dimitri Linten
IMEC

Tanya Nigam
GlobalFoundries

Anthony S. Oates
TSMC

Cora Salm
University of Twente

Miaomiao Wang
IBM

Ehrenfried Zschech
FhG