IEDM

IEDM Characterization, Reliability and Yield Committee

Su Jin Ahn, Chair
Samsung
Gyeonggi-do, Korea

Tzu-Hsuan Hsu
Macronix

Jiezhi Chen
Shandong University

Jungwoo Joh
TI

Patrick Justison
Globalfoundries

Chris Kim
University of Minnesota

Seokkiu Lee
SK Hynix

Anthony S. Oates
TSMC

Steven Ramey
Intel

Cora Salm
University of Twente

Guido Sasse
NXP

James Stathis
IBM

Ehrenfried Zschech
FhG